Cardellach, Estel; Wickert, Jens; Baggen, Rens; Benito, Javier; Camps, Adriano; Catarino, Nuno; Chapron, Bertrand; Dielacher, A.; Fabra Cervellera, Fran; Flato, Greg; Fragner, H.; Gabarró, Carolina; Gommenginger, Christine; Haas, Christian; Healy, Sean; Hernández-Pajares, Manuel; Høeg, P.; Jäggi, Adrian; Kainulainen, Juha; Khan, Shfaqat Abbas; Lemke, Norbert M.K.; Li, Weiqiang; Nghiem, Son V.; Pierdicca, Nazzareno; Portabella, Marcos; Rautiainen, Kimmo; Rius, Antonio; Sasgen, Ingo; Semmling, Maximilian; Shum, C.K.; Soulat, François; Steiner, Andrea K.; Tailhades, Sébastien; Thomas, Maik; Vilaseca, R.; Zuffada, Cinzia;
(2018).
IEEE Access, 6: 13980-14018.
DOI: 10.1109/ACCESS.2018.2814072
URI: http://hdl.handle.net/10261/164395